Project name: Efficient computational methods for materials characterization at the nanoscale
Project programme: INTER EXCELLENCE II
Project code: LUASK22008
Project provider: Ministry of Education, Youth and Sports of the Czech Republic
Project implementation: 1.7.2022 - 30.6.2025
Responsible project coordinator: Mgr. Petr Klapetek Ph.D., CMI
Project coordinator of CMI: Mgr. Petr Klapetek, Ph.D., CMI
Other project participants: Institute of Measurement of the Slovak Academy of Sciences
Project management summary: The aim of the project is to design and implement efficient computational methods for evaluating measurements of mechanical properties of materials at the nanoscale by instrumented indentation techniques (IIT) and atomic force microscopy (AFM). Both of these methods are capable of providing very localized information about the mechanical properties of the material, such as Young's modulus (both), hardness (IIT) or adhesion between the measuring tip and the surface (AFM). The principle is to analyze the recording of the position of the measuring tip and the force interaction between the tip and the sample surface. From this perspective, the goals for both types of techniques are the same, although the implementation will differ - in IIT the emphasis is on the most accurate post-measurement processing, in AFM on fast in-process processing. The chosen mathematical approach should unify the two approaches, thus increasing the accuracy of the measurements and facilitating the comparison or combination of the two methods.